-a.電性量測與光學量測系統

電性量測平台-Electrical measurement system

半導體元件真空變溫參數特性-Vacuum IV/CV Probe Station

高頻元件參數-RF Probe and TDR analysis system

光電元件參數-LD/LED LIV Probe System

太陽能薄膜參數特性-Solar cell Probe System

薄膜四點探針-Four Point Sheet Resistivity Probe System

薄膜霍爾效應-Van Der Pauw/Hall Probe System

高壓高電流元件參數-High Voltage/High Current Probe System

磁場元件參數特性-3D Magnetic Field Platform

非接觸式量測系統-Non-Contact Corona-Kelvin Metrology

噴墨沈積系統-lnkjet Deposition System

壓電、熱電、介電元件參數參數特性-Piezoelectric,Dielectric,and Seebeck Measurement System