半導體元件真空變溫參數特性-Vacuum IV/CV Probe Station 高頻元件參數-RF Probe and TDR analysis system 光電元件參數-LD/LED LIV Probe System 太陽能薄膜參數特性-Solar cell Probe System 薄膜四點探針-Four Point Sheet Resistivity Probe System 薄膜霍爾效應-Van Der Pauw/Hall Probe System 高壓高電流元件參數-High Voltage/High Current Probe System 磁場元件參數特性-3D Magnetic Field Platform 非接觸式量測系統-Non-Contact Corona-Kelvin Metrology 噴墨沈積系統-lnkjet Deposition System 壓電、熱電、介電元件參數參數特性-Piezoelectric,Dielectric,and Seebeck Measurement System ![]() |